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The AWG400 Series performs a wide range of
modulated (I&Q) and mixed signal simulations
(analog & digital) for wireless and wired data
communication, in addition to semiconductor
device characterization.
The AWG400 is ideal for design or manufacturing test engineers who need to replicate
marginal and erroneous mixed signal conditions. The only product in its class offering
200 MS/s, 16-Bit vertical resolution, 1, 2 or 3
channel configurations and optional digital
outputs (16, 32 or 48), the AWG400 is a
superior choice for those who need an additional channel, longer memory or higher vertical resolution. The color display, graphical user
interface and stand-alone Microsoft Windowsbased waveform creating utility supports quick
creation, editing and output of custom or
imported waveforms.
Features & Benefits
1, 2 or 3 Independent
Waveform Channels
16-Bit (1/65536) Vertical
Resolution
200 MS/s Sample Rate
Up to 16 M Record Length
Optional 16/32/48-Bit 100
MHz (CMOS) Digital Data
Generator for Mixed-signal
Device Testing
2, 4 or 6 Digital Marker
Outputs
Channel Internal
Independent Noise Generator
Independent Channel
Skew Control
Independent Channel
External Signal ADD-INPUT
External Clock and External
Reference Inputs