리퍼비시 계측기
Conduct limit test Pass/Fail testing against a “golden” waveform with tolerances
Perform mask testing on ITU-T, ANSI T1.102, and USB standards
Perform mask testing on custom user-defined masks
Detailed test statistics provide insight into true signal behavior
Customizable tests allow for multiple actions upon violations or test failures
High waveform capture rates enable thousands of waveforms to be tested per second
Mask source : Any Ch1 – Ch4 or any R1 – R4
Test source : Any Ch1 – Ch4
Mask creation margins : Vertical tolerance from 0 to 1 division in 1 m (1/1000th) division increments
Horizontal tolerance from 0 to 500 m division in 1 m (1/1000th) division increments