리퍼비시 계측기

리퍼비시 계측기


  • ModelZ4441
  • MakerLitepoint
  • Description300 MHz Analog Digitizer/Oscilloscope
  • Rental문의요망
  • Stock문의요망

The z4441 Digitizer/Oscilloscope offers a fast 800 MS/s sampling rate, 300 MHz analog bandwidth, and high 14-bit ADC dynamic range for a variety of applications, including transient signal capture, audio and video signal analysis, and real-time oscilloscope functionality. The z4441 provides two digitizer channels with on-instrument memory of 256 MiSamples (128 MiSamples/channel).

Bandwidth, Fast Sampling & Deep Memory for a Variety of Applications

  • Real-time sampling up to 800 MS/s
  • Equivalent and interpolated sampling up to 100 GS/s
  • Wide analog bandwidth
  • 300 MHz typical, 250 MHz minimum (Standard Option)
  • 250 MHz typical, 200 MHz minimum (Differential Option)
  • On-instrument deep memory (256 MiSamples)
  • Continuous memory mode for long waveform capture
  • Segmented memory mode for analysis of repetitive signals and statistical analysis

Oscilloscope Functionality

  • On-board measurements of over 40 waveform parameters related to voltage, time, and frequency
  • Four calculation channels for waveform math, digital filtering, FFT, and more
  • Four non-volatile reference channels for storing and comparing waveforms
  • Store and recall instrument settings files from on-board non-volatile memory
  • Multiple acquisition modes including averaging, high-resolution, peak detect, and envelope
  • Advanced measurement modes include limit and mask testing, histograms, and gated measurements
  • Pattern, glitch, pulse width, video, and dual-event cascading trigger capability
  • High-speed data transfer rates up to full bus bandwidth specifications
  • Timing and triggering capabilities support multiple board synchronization


  • High-resolution transient signal capture
  • Video, radio and high-frequency analog signal capture
  • Differential signal capture for current measurements, common-mode noise immunity, floating ground, etc.
  • General-purpose oscilloscope viewing, analysis and measurements


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